Invention Grant
- Patent Title: Apparatus for measuring in-phase and quadrature (IQ) imbalance
- Patent Title (中): 用于测量同相和正交(IQ)不平衡的装置
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Application No.: US12027762Application Date: 2008-02-07
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Publication No.: US07995645B2Publication Date: 2011-08-09
- Inventor: Kyeongho Lee , Joonbae Park , Jeong Woo Lee , Seung-Wook Lee , Eal Wan Lee
- Applicant: Kyeongho Lee , Joonbae Park , Jeong Woo Lee , Seung-Wook Lee , Eal Wan Lee
- Applicant Address: US CA San Jose
- Assignee: GCT Semiconductor, Inc.
- Current Assignee: GCT Semiconductor, Inc.
- Current Assignee Address: US CA San Jose
- Agency: Muir Patent Consulting, PLLC
- Main IPC: H04B3/46
- IPC: H04B3/46

Abstract:
The present general inventive concept relates to apparatuses and/or methods for measuring an in-phase and quadrature (IQ) imbalance. In one embodiment, a signal generator can provide a first IQ signal of a DC component during a first period and the first IQ signal of a first angular frequency during a second period, an IQ up-conversion mixer can up-convert the first IQ signal by a second angular frequency during the first period and up-convert the first IQ signal by a third angular frequency during the second period to output a second IQ signal, an IQ down-conversion mixer can down-convert the second IQ signal by the third angular frequency to output a third IQ signal and an IQ imbalance detector can obtain a first IQ imbalance (e.g., Rx IQ imbalance) from the third IQ signal during the first period and a second IQ imbalance (e.g., Tx/Rx IQ imbalance) during the second period.
Public/Granted literature
- US20080212662A1 APPARATUS FOR MEASURING IQ IMBALANCE Public/Granted day:2008-09-04
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