Invention Grant
US07996404B2 System and method for detecting and analyzing pattern relationships
有权
用于检测和分析模式关系的系统和方法
- Patent Title: System and method for detecting and analyzing pattern relationships
- Patent Title (中): 用于检测和分析模式关系的系统和方法
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Application No.: US12320538Application Date: 2009-01-28
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Publication No.: US07996404B2Publication Date: 2011-08-09
- Inventor: Andrew Wong , Chung Lam Li
- Applicant: Andrew Wong , Chung Lam Li
- Applicant Address: CA Waterloo
- Assignee: Pattern Discovery Technologies Inc.
- Current Assignee: Pattern Discovery Technologies Inc.
- Current Assignee Address: CA Waterloo
- Agency: Gowling Lafleur Henderson LLP
- Agent Grant Tisdall
- Main IPC: G06F17/30
- IPC: G06F17/30

Abstract:
In its broad aspect, the invention provides a method for analyzing relationships among patterns within a data set having a set of samples and associated attribute values defining each attribute of each said sample. The method comprises receiving at an input at least two patterns; defining a data cluster within the data set for each of said at least two patterns, each defined data cluster having samples with attribute values associated with a corresponding pattern of said at least two patterns; grouping at least some of the samples of each defined data cluster with one another to generate a resultant data cluster; and calculating a variation between the attribute values of a first set of samples and the attribute values of a second set of samples within said resultant data cluster, the attribute values of the first set of samples and the second set of samples corresponding to the same attribute.
Public/Granted literature
- US20100010985A1 System and method for detecting and analyzing pattern relationships Public/Granted day:2010-01-14
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