Invention Grant
- Patent Title: System and method for testing overclocking capability of CPU
- Patent Title (中): 用于测试CPU超频能力的系统和方法
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Application No.: US12261023Application Date: 2008-10-29
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Publication No.: US07996702B2Publication Date: 2011-08-09
- Inventor: Dong-Hai Xue , De-Yuan Dong
- Applicant: Dong-Hai Xue , De-Yuan Dong
- Applicant Address: CN Shenzhen, Guangdong Province TW Tu-Cheng, New Taipei
- Assignee: Hong Fu Jin Precision Industry (Shen Zhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hong Fu Jin Precision Industry (Shen Zhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Shenzhen, Guangdong Province TW Tu-Cheng, New Taipei
- Agent Zhigang Ma
- Priority: CN200810304542 20080917
- Main IPC: G06F1/00
- IPC: G06F1/00

Abstract:
A test system for overclocking capability of a central processing unit (CPU) includes a basic input and output system (BIOS), a frequency generator, and a watchdog timer. The BIOS includes an input module, a watchdog control module, and a frequency increasing module. The input module inputs an initial frequency of a CPU to the frequency generator to adjust a real-time frequency of the CPU. The watchdog control module sends a counter signal to the watchdog timer in a preset time interval. The watchdog timer receives the counter signal. If the watchdog timer does not receive the counter signal within the preset time, the watchdog timer outputs a reset signal to restart the computer. The frequency increasing module adds a preset increment to the real-time frequency to obtain a newly adjusted frequency, and provides the newly adjusted frequency to the frequency generator to adjust the real-time frequency.
Public/Granted literature
- US20100070792A1 SYSTEM AND METHOD FOR TESTING OVERCLOCKING CAPABILITY OF CPU Public/Granted day:2010-03-18
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