Invention Grant
US07996703B2 Method and apparatus to avoid power transients during a microprocessor test
失效
在微处理器测试期间避免功率瞬变的方法和装置
- Patent Title: Method and apparatus to avoid power transients during a microprocessor test
- Patent Title (中): 在微处理器测试期间避免功率瞬变的方法和装置
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Application No.: US12023550Application Date: 2008-01-31
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Publication No.: US07996703B2Publication Date: 2011-08-09
- Inventor: Michael Stephen Floyd , Norman Karl James , Jeffrey William Kellington , Larry S. Leitner
- Applicant: Michael Stephen Floyd , Norman Karl James , Jeffrey William Kellington , Larry S. Leitner
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Yee & Associates, P.C.
- Agent Thomas E. Tyson
- Main IPC: G06F1/04
- IPC: G06F1/04 ; G06F1/14

Abstract:
Exemplary embodiments provide a computer-implemented method and a system for a startup cycle for a cycle deterministic start. An initializing mechanism applies power to a microprocessor. The initializing mechanism initializes the configuration of the microprocessor. The initializing mechanism initializes a timer. The initializing mechanism then sends a clock start command to the microprocessor. The clocks on the microprocessor are started. Upon the clocks starting, the timer begins and allows temporary transients, such as voltage droop due to a large instantaneous change in demand for current due to the commencement of clock switching. Responsive to the timer reaching a target value, an interrupt unit sends a system reset interrupt. Responsive to the interrupt unit sending the system reset interrupt, an instruction fetch unit fetches a first instruction. This operation will be deterministic to the state of the rest of the microprocessor memory elements (latches, arrays, et al.).
Public/Granted literature
- US20090199027A1 METHOD AND APPARATUS TO AVOID POWER TRANSIENTS DURING A MICROPROCESSOR TEST Public/Granted day:2009-08-06
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