Invention Grant
US07996738B2 Semiconductor chip with a plurality of scannable storage elements and a method for scanning storage elements on a semiconductor chip
有权
具有多个可扫描存储元件的半导体芯片和用于扫描半导体芯片上的存储元件的方法
- Patent Title: Semiconductor chip with a plurality of scannable storage elements and a method for scanning storage elements on a semiconductor chip
- Patent Title (中): 具有多个可扫描存储元件的半导体芯片和用于扫描半导体芯片上的存储元件的方法
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Application No.: US12042944Application Date: 2008-03-05
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Publication No.: US07996738B2Publication Date: 2011-08-09
- Inventor: Tobias Gemmeke , Christoph Jaeschke , Jens Kuenzer , Cedric Lichtenau , Thomas Pflueger , Jochen Preiss
- Applicant: Tobias Gemmeke , Christoph Jaeschke , Jens Kuenzer , Cedric Lichtenau , Thomas Pflueger , Jochen Preiss
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Michael J. LeStrange
- Main IPC: G01R31/28
- IPC: G01R31/28
Abstract:
A semiconductor chip subdivided into power domains, at least one of the power domains is separately activated or deactivated and at least a part of the scannable storage elements are interconnected to one or more scan chains. At least one scan chain is serially subdivided into scan chain portions and the scan chain portion is arranged within one of the power domains. For at least one scan chain portion a bypass line is provided for passing by scan data and at least one select unit is provided for selecting between the bypass line and the corresponding scan chain portion in dependence of the activated or deactivated state of the corresponding power domains.
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