Invention Grant
US07996795B2 Method and apparatus for performing stress modeling of integrated circuit material undergoing material conversion 有权
用于进行材料转换的集成电路材料的应力模拟的方法和装置

  • Patent Title: Method and apparatus for performing stress modeling of integrated circuit material undergoing material conversion
  • Patent Title (中): 用于进行材料转换的集成电路材料的应力模拟的方法和装置
  • Application No.: US12429900
    Application Date: 2009-04-24
  • Publication No.: US07996795B2
    Publication Date: 2011-08-09
  • Inventor: Victor MorozXiaopeng Xu
  • Applicant: Victor MorozXiaopeng Xu
  • Applicant Address: US CA Mountain View
  • Assignee: Synopsys, Inc.
  • Current Assignee: Synopsys, Inc.
  • Current Assignee Address: US CA Mountain View
  • Agency: Haynes Beffel & Wolfeld LLP
  • Agent Kenta Suzue
  • Main IPC: G06F17/50
  • IPC: G06F17/50
Method and apparatus for performing stress modeling of integrated circuit material undergoing material conversion
Abstract:
A method, a computer medium storing computer instructions performing a method, and a computer with processor and memory perform stress modeling as follows. The stress model transforms a representation of a material conversion of a first material in the integrated circuit to a second material in the integrated circuit. Prior to the material conversion the first material occupies a first space having a first boundary. After the material conversion the first material and the second material together occupy a second space having a second boundary. The first space and the second space are different. The stress model performed by the computer system transforms the representation of the material conversion of the first material to the second material into: i) the first material occupying the first space having the first boundary, and ii) a strain displacement condition of the first material. The strain displacement condition is determined by a spatial change from the first boundary to the second boundary.
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