Invention Grant
US07996805B2 Method of stitching scan flipflops together to form a scan chain with a reduced wire length 有权
将扫描触发器拼接在一起以形成具有减少的线长度的扫描链的方法

Method of stitching scan flipflops together to form a scan chain with a reduced wire length
Abstract:
The scan flipflops on a semiconductor chip are stitched together to form one or more scan chains, located in one or more standard cell placement regions, after the optimal physical location of each scan flip-flop has been determined. As a result, the total length of the scan chain wires is substantially reduced, thereby reducing on-chip wiring congestion, flip-flop load capacitance, and flipflop power dissipation.
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