Invention Grant
- Patent Title: Shape measuring apparatus and shape measuring method
- Patent Title (中): 形状测量仪和形状测量方法
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Application No.: US12476518Application Date: 2009-06-02
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Publication No.: US08006402B2Publication Date: 2011-08-30
- Inventor: Keiichi Yoshizumi , Masateru Doi , Takayuki Kurata
- Applicant: Keiichi Yoshizumi , Masateru Doi , Takayuki Kurata
- Applicant Address: JP Osaka
- Assignee: Panasonic Corporation
- Current Assignee: Panasonic Corporation
- Current Assignee Address: JP Osaka
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JP2008-145945 20080603
- Main IPC: G01B11/24
- IPC: G01B11/24 ; G01B5/20

Abstract:
A moving vector calculation unit calculates a moving vector M representing a quantity and a direction of movement of a probe on basis of a stylus displacement vector, a stylus displacement vector D, and a direction change angle θ of the stylus displacement vector D that is caused by a frictional force between a stylus 32 and the measuring surface 5a during scanning of the measuring surface 5a by the stylus 32. The stylus displacement vector D is a vector including a quantity and a direction of position displacement of the stylus 32 relative to the probe 5. Movement of an XY-stage 7 is controlled so that the probe 6 moves in accordance with the moving vector M.
Public/Granted literature
- US20090299692A1 SHAPE MEASURING APPARATUS AND SHAPE MEASURING METHOD Public/Granted day:2009-12-03
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