Invention Grant
US08007865B2 Atomic layer deposition (ALD) method and reactor for producing a high quality layer
有权
原子层沉积(ALD)方法和反应器,用于生产高质量的层
- Patent Title: Atomic layer deposition (ALD) method and reactor for producing a high quality layer
- Patent Title (中): 原子层沉积(ALD)方法和反应器,用于生产高质量的层
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Application No.: US11444132Application Date: 2006-05-31
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Publication No.: US08007865B2Publication Date: 2011-08-30
- Inventor: Annelies Delabie , Matty Caymax
- Applicant: Annelies Delabie , Matty Caymax
- Applicant Address: BE Leuven
- Assignee: IMEC
- Current Assignee: IMEC
- Current Assignee Address: BE Leuven
- Agency: Knobbe Martens Olson & Bear LLP
- Priority: EP05447261 20051125
- Main IPC: C23C16/00
- IPC: C23C16/00

Abstract:
One inventive aspect is related to an atomic layer deposition (ALD) method comprising: a) providing a semiconductor substrate in a reactor, b) providing a pulse of a first precursor gas into the reactor at a first temperature, c) providing a first pulse of a second precursor gas into the reactor at a second temperature, and d) providing a second pulse of the second precursor gas at a third temperature lower than the second temperature. Another inventive aspect relates to a reactor suitable to apply the method.
Public/Granted literature
- US20060286810A1 Atomic layer deposition (ALD) method and reactor for producing a high quality layer Public/Granted day:2006-12-21
Information query
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