Invention Grant
- Patent Title: Manufacturing method of semiconductor device
- Patent Title (中): 半导体器件的制造方法
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Application No.: US12892993Application Date: 2010-09-29
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Publication No.: US08008123B2Publication Date: 2011-08-30
- Inventor: Syota Miki
- Applicant: Syota Miki
- Applicant Address: JP Nagano
- Assignee: Shinko Electric Industries Co., Ltd.
- Current Assignee: Shinko Electric Industries Co., Ltd.
- Current Assignee Address: JP Nagano
- Agency: IPUSA, PLLC
- Priority: JP2009-287903 20091218
- Main IPC: H01L21/00
- IPC: H01L21/00

Abstract:
A manufacturing method of a semiconductor device, including a first step of forming a first electrode pad at an external edge part of a semiconductor chip mounting area of a supporting board; a second step of fixing a rear surface of a semiconductor chip having a main surface, the main surface where a second electrode pad is formed, to an inside of an area of the main surface of the supporting board, the area where the first electrode pad is formed; a third step of forming a first internal connecting terminal on the first electrode pad, and forming a second internal connecting terminal on the second electrode pad; and a fourth step of forming a first insulation layer on the main surface of the supporting board.
Public/Granted literature
- US20110151645A1 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE Public/Granted day:2011-06-23
Information query
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