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US08008150B2 Methods of fabricating flash memory devices including substantially uniform tunnel oxide layers 失效
制造闪存器件的方法包括基本均匀的隧道氧化物层

Methods of fabricating flash memory devices including substantially uniform tunnel oxide layers
Abstract:
A method of forming a flash memory device in a memory cell region of a substrate includes forming a first insulating layer on the substrate, forming a first conductive layer on the first insulating layer, forming trench isolation regions in the substrate extending through the first conductive layer and the first insulating layer to define an active region in the memory cell region between the trench isolation regions, and selectively removing the first conductive layer and the first insulating layer from the memory cell region of the substrate to expose a surface of the active region between the trench isolation regions.
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