Invention Grant
- Patent Title: Ion implantation apparatus and method of correcting deviation angle of ion beam
- Patent Title (中): 离子注入装置及校正离子束偏离角的方法
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Application No.: US12305594Application Date: 2007-06-22
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Publication No.: US08008630B2Publication Date: 2011-08-30
- Inventor: Takatoshi Yamashita
- Applicant: Takatoshi Yamashita
- Applicant Address: JP Kyoto
- Assignee: Nissin Ion Equipment Co., Ltd.
- Current Assignee: Nissin Ion Equipment Co., Ltd.
- Current Assignee Address: JP Kyoto
- Agency: Osha • Liang LLP
- Priority: JP2006-175127 20060626; JP2007-133001 20070518
- International Application: PCT/JP2007/062578 WO 20070622
- International Announcement: WO2008/001685 WO 20080103
- Main IPC: G21K1/08
- IPC: G21K1/08 ; H01J3/14 ; H01J3/26 ; H01J49/42 ; A61N5/00 ; G21G5/00

Abstract:
To increase a transport efficiency of an ion beam by correcting Y-direction diffusion caused by the space charge effect of the ion beam between an ion beam deflector, which separates the ion beam and neutrons from each other, and a target. An ion implantation apparatus has a beam paralleling device that bends an ion beam scanned in an X direction by magnetic field to be parallel and draws a ribbon-shaped ion beam. The beam paralleling device serves also as an ion beam deflector that deflects the ion beam by magnetic field to separates neutrons from the ion beam. In the vicinity of an outlet of the beam paralleling device, there is provided an electric field lens having a plurality of electrodes opposed to each other in a Y direction with a space for passing the ion beam and narrowing the ion beam in the Y direction.
Public/Granted literature
- US20090289193A1 ION IMPLANTING APPARATUS AND ION BEAM DEFLECTION ANGLE CORRECTING METHOD Public/Granted day:2009-11-26
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