Invention Grant
- Patent Title: Heat-dissipating semiconductor package structure and method for manufacturing the same
- Patent Title (中): 散热半导体封装结构及其制造方法
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Application No.: US12150047Application Date: 2008-04-23
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Publication No.: US08008769B2Publication Date: 2011-08-30
- Inventor: Wen-Tsung Tseng , Ho-Yi Tsai , Chien-Ping Huang , Cheng-Hsu Hsiao
- Applicant: Wen-Tsung Tseng , Ho-Yi Tsai , Chien-Ping Huang , Cheng-Hsu Hsiao
- Applicant Address: TW Taichung
- Assignee: Siliconware Precision Industries Co., Ltd.
- Current Assignee: Siliconware Precision Industries Co., Ltd.
- Current Assignee Address: TW Taichung
- Agency: Edwards Angell Palmer & Dodge LLP
- Agent Peter F. Corless; Steven M. Jensen
- Priority: TW96114195A 20070423
- Main IPC: H01L23/34
- IPC: H01L23/34

Abstract:
A heat-dissipating semiconductor package structure and a method for manufacturing the same is disclosed. The method includes: disposing on and electrically connecting to a chip carrier at least a semiconductor chip and a package unit; disposing on the top surface of the package unit a heat-dissipating element having a flat portion and a supporting portion via the flat portion; receiving the package unit and semiconductor chip in a receiving space formed by the flat portion and supporting portion of the heat-dissipating element; and forming on the chip carrier encapsulant for encapsulating the package unit, semiconductor chip, and heat-dissipating element. The heat-dissipating element dissipates heat generated by the package unit, provides EMI shielding, prevents delamination between the package unit and the encapsulant, decreases thermal resistance, and prevents cracking.
Public/Granted literature
- US20080258294A1 Heat-dissipating semiconductor package structure and method for manufacturing the same Public/Granted day:2008-10-23
Information query
IPC分类: