Invention Grant
- Patent Title: Burn-in system for electronic devices
- Patent Title (中): 电子设备老化系统
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Application No.: US12481592Application Date: 2009-06-10
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Publication No.: US08008934B2Publication Date: 2011-08-30
- Inventor: Wei Ping Wong , Chee Keong Chiew , Kok Hua Lee
- Applicant: Wei Ping Wong , Chee Keong Chiew , Kok Hua Lee
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Agent Charles Bergere
- Main IPC: G01R31/10
- IPC: G01R31/10
Abstract:
A burn-in system (10) includes an enclosure (12) defining a burn-in chamber (14). The enclosure (12) is configured to be mounted on a burn-in board (34) over a burn-in socket (36). A heating element (16) is configured to generate heat within the burn-in chamber (14) and a temperature sensor (18) is configured to sense a temperature within the burn-in chamber (14). An opening (24) is formed in the enclosure (12) for receiving a fluid (26). A controller (20) is configured to control the heating element (16) and fluid flow into the enclosure (12) in response to the temperature sensed by the temperature sensor (18).
Public/Granted literature
- US20100315109A1 BURN-IN SYSTEM FOR ELECTRONIC DEVICES Public/Granted day:2010-12-16
Information query
