A component test apparatus performing a test on an electronic component is disclosed. The component test apparatus includes a component loading device, a transport hand, and a component unloading device. A plurality of functional stations have mutually different functions and are spaced apart at equal intervals along a movement direction of the transport hand. The transport hand has a plurality of index units that are capable of holding the electronic component independently from one another and operating independently from one another. The index units are spaced apart at intervals equal to the intervals at which the functional stations are spaced apart along a transport direction of the electronic component from a loading position toward a test position.