Invention Grant
- Patent Title: Lens module distortion measuring system and method
- Patent Title (中): 镜头模块失真测量系统及方法
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Application No.: US12555878Application Date: 2009-09-09
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Publication No.: US08009281B2Publication Date: 2011-08-30
- Inventor: Jen-Tsorng Chang
- Applicant: Jen-Tsorng Chang
- Applicant Address: TW Tu-Cheng, New Taipei
- Assignee: Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: TW Tu-Cheng, New Taipei
- Agency: Altis Law Group, Inc.
- Priority: CN200810304453 20080910
- Main IPC: G01B9/00
- IPC: G01B9/00

Abstract:
A lens module distortion measuring system configured to measure the distortion of a lens module including: a light source configured to emit light rays; a diffusing panel configured to diffuse the light rays; a substantially opaque shielding plate beneath the diffusing panel, the shielding plate defining a regular matrix of light-passing holes capable of allowing some of the diffused light rays to pass therethrough; an image capturing device configured to capture a image of the shielding plate as viewed through the lens module, the image comprising an array of light spots corresponding to the light-passing holes; and a computing unit electrically connected to the image capturing device and configured to analyze the light spots of the image and thereby determine the distortion of the lens module.
Public/Granted literature
- US20100060882A1 LENS MODULE DISTORTION MEASURING SYSTEM AND METHOD Public/Granted day:2010-03-11
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