Invention Grant
- Patent Title: Method for beam calibration and usage of a calibration body
- Patent Title (中): 用于光束校准和使用校准体的方法
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Application No.: US11813334Application Date: 2006-01-05
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Publication No.: US08009299B2Publication Date: 2011-08-30
- Inventor: Matthias Brunner , Ralf Schmid , Bernhard Mueller , Axel Wenzel
- Applicant: Matthias Brunner , Ralf Schmid , Bernhard Mueller , Axel Wenzel
- Applicant Address: DE Dresden
- Assignee: Applied Materials GmbH
- Current Assignee: Applied Materials GmbH
- Current Assignee Address: DE Dresden
- Agency: Patterson & Sheridan, L.L.P.
- Priority: DE102005000813 20050105
- International Application: PCT/EP2006/000068 WO 20060105
- International Announcement: WO2006/072583 WO 20060713
- Main IPC: G01B11/14
- IPC: G01B11/14

Abstract:
The invention relates to a method of calibration of the beam position of a corpuscular beam. A calibration body with structures is used, wherein the structures have a structure period PS in the plain section and within each structure there is a position L intended for the measurement. For the calibration, at least one detection signal each at structures in the plain section of the calibration body is generated, wherein the corpuscular beam is deflected with deflectors on beam target positions L1 with the beam target period P1, which is larger than half of the structure period PS, whereby a basic calibration is used for the control of the deflectors, and wherein the beam target deflections deviate either in the beam target period P1 from the structure period PS and/or in the beam target position L1 from the position L.
Public/Granted literature
- US20100188666A1 METHOD FOR BEAM CALIBRATION AND USAGE OF A CALIBRATION BODY Public/Granted day:2010-07-29
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