Invention Grant
- Patent Title: Isolating faulty decoupling capacitors
- Patent Title (中): 隔离有缺陷的去耦电容
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Application No.: US12478477Application Date: 2009-06-04
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Publication No.: US08009398B2Publication Date: 2011-08-30
- Inventor: Vikas Agarwal , Sanjay Dubey , Ankit K. Gheedia , Nikhil Kejriwal , Sankara Reddy S. Kommareddi
- Applicant: Vikas Agarwal , Sanjay Dubey , Ankit K. Gheedia , Nikhil Kejriwal , Sankara Reddy S. Kommareddi
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Patterson & Sheridan, LLP
- Agent James R. Nock
- Main IPC: H02H3/22
- IPC: H02H3/22

Abstract:
The present invention generally provides a decoupling capacitor circuit that is configured to determine whether a decoupling capacitor is defective. Upon determining that the decoupling capacitor is defective, the decoupling capacitor circuit may disconnect the decoupling capacitor from both, a positive segment and a negative segment of a power grid. In some embodiments, the decoupling capacitor circuit may be configured to reconnect the decoupling capacitor to the power grid upon receiving a reset signal.
Public/Granted literature
- US20100308663A1 ISOLATING FAULTY DECOUPLING CAPACITORS Public/Granted day:2010-12-09
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