Invention Grant
- Patent Title: Scalable self-checking processing platform including processors executing both coupled and uncoupled applications within a frame
- Patent Title (中): 可扩展的自检处理平台,包括在帧内执行耦合和非耦合应用的处理器
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Application No.: US12419153Application Date: 2009-04-06
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Publication No.: US08010846B1Publication Date: 2011-08-30
- Inventor: Byron Birkedahl , Nicholas Wilt , Art McCready , Brendan Hall , Aaron Larson
- Applicant: Byron Birkedahl , Nicholas Wilt , Art McCready , Brendan Hall , Aaron Larson
- Applicant Address: US NJ Morristown
- Assignee: Honeywell International Inc.
- Current Assignee: Honeywell International Inc.
- Current Assignee Address: US NJ Morristown
- Agency: Fogg & Powers LLC
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/14

Abstract:
Methods and systems for a scalable self-checking processing platform are described herein. According to one embodiment, during an execution frame, a first processing element executes both a high-criticality application and a first low-criticality application. During that same execution frame, a second processing element executes both the high-criticality application and a second low-criticality application. The high-criticality application output from the first processing element is compared with that from the second processing element before the next execution frame, and a fault occurs when the output does not match. The low-criticality application is not duplicated or compared. This and other embodiments allow high-criticality applications to be appropriated checked while avoiding the over-dedication of resources to low-criticality applications that do not warrant self-checking.
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