Invention Grant
- Patent Title: Method and circuit for brownout detection in a memory system
- Patent Title (中): 存储器系统中掉电检测的方法和电路
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Application No.: US12473934Application Date: 2009-05-28
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Publication No.: US08010854B2Publication Date: 2011-08-30
- Inventor: Stephen F. McGinty , Jochen Lattermann , Ross S. Scouller
- Applicant: Stephen F. McGinty , Jochen Lattermann , Ross S. Scouller
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Agent Joanna G. Chiu; James L. Clingan, Jr.
- Main IPC: G11C29/00
- IPC: G11C29/00

Abstract:
Detecting brown-out in a system having a non-volatile memory (NVM) includes loading data in the NVM, wherein a next step in loading is performed on a location in the NVM that is logically sequential to an immediately preceding loading. A pair of adjacent locations include one with possible data and another that is empty. Determining which of the two, if at all, have experienced brownout includes using two different sense references. One has a higher standard for detecting a logic high and the other higher standard for detecting a logic low. Results from using the two different references are compared. If the results are the same for both references, then there is no brownout. If the results are different for either there has been a brownout. The location with the different results is set to an invalid state as the location that has experienced the brownout.
Public/Granted literature
- US20100306604A1 METHOD AND CIRCUIT FOR BROWNOUT DETECTION IN A MEMORY SYSTEM Public/Granted day:2010-12-02
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