Invention Grant
- Patent Title: Insulating film pattern, method for manufacturing the same, and method for manufacturing thin film transistor substrate using the same
- Patent Title (中): 绝缘膜图案及其制造方法以及使用其制造薄膜晶体管基板的方法
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Application No.: US12423542Application Date: 2009-04-14
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Publication No.: US08012845B2Publication Date: 2011-09-06
- Inventor: Dae-Jin Park , Kyu-Young Kim
- Applicant: Dae-Jin Park , Kyu-Young Kim
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: H.C. Park & Associates, PLC
- Priority: KR10-2008-0094787 20080926
- Main IPC: H01L21/76
- IPC: H01L21/76

Abstract:
In an insulating film pattern, a first pattern part is formed at one surface of the insulating film pattern to form a source electrode, a drain electrode, and a semiconductor layer of the thin film transistor. The first pattern part is recessed in one surface of the insulating film pattern. The insulating film pattern is formed on a substrate through an imprint scheme, and is deposited on a base substrate having a gate electrode and a gate line through a contact print scheme. A source electrode, drain electrode, and semiconductor layer of a thin film transistor are formed through an inkjet print scheme using a first pattern part of the insulating film pattern. A gate electrode and gate line may be formed using a second pattern part of the insulating film pattern.
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