Invention Grant
- Patent Title: Charged-particle detector
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Application No.: US12607410Application Date: 2009-10-28
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Publication No.: US08013294B2Publication Date: 2011-09-06
- Inventor: Motohiro Suyama , Takayuki Ohmura , Hiroshi Kobayashi
- Applicant: Motohiro Suyama , Takayuki Ohmura , Hiroshi Kobayashi
- Applicant Address: JP Hamamatsu-shi, Shizuoka
- Assignee: Hamamatsu Photonics K.K.
- Current Assignee: Hamamatsu Photonics K.K.
- Current Assignee Address: JP Hamamatsu-shi, Shizuoka
- Agency: Drinker Biddle & Reath LLP
- Priority: JP2008-143403 20080530
- Main IPC: H01J49/40
- IPC: H01J49/40 ; H01J43/00

Abstract:
This ion detector includes an MCP and a plurality of planar dynodes respectively having a plurality of slits. The plurality of planar dynodes are stacked via spacers parallel to an electron output plane of the MCP, and the first stage planar dynode is opposed parallel to the electron output plane. In accordance with this ion detector, it is possible to obtain output signals having the linearity reaching mV order, and to shorten its pulse width to approximately 600 ps.
Public/Granted literature
- US20110095174A1 Charged-particle detector Public/Granted day:2011-04-28
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