Invention Grant
- Patent Title: Exposure apparatus, exposure method, and device fabrication method
- Patent Title (中): 曝光装置,曝光方法和装置制造方法
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Application No.: US12120747Application Date: 2008-05-15
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Publication No.: US08013976B2Publication Date: 2011-09-06
- Inventor: Takafumi Miyaharu
- Applicant: Takafumi Miyaharu
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Canon U.S.A., Inc. IP Division
- Priority: JP2007-134584 20070521
- Main IPC: G03B27/68
- IPC: G03B27/68

Abstract:
The present invention provides an exposure apparatus which exposes a substrate via a liquid, comprising a measurement substrate including a transmission part configured to transmit a light beam having passed through a projection optical system, a light-receiving unit including a light-receiving surface configured to receive the light beam transmitted through the liquid and the transmission part, and a calculator configured to arithmetically convert a light intensity distribution, on the light-receiving surface, of the light beam received by the light-receiving surface into a light intensity distribution on a pupil plane of the projection optigottacal system, based on information indicating a correlation between a position coordinate on the light-receiving surface and a position coordinate on the pupil of the projection optical system.
Public/Granted literature
- US20080291421A1 EXPOSURE APPARATUS, EXPOSURE METHOD, AND DEVICE FABRICATION METHOD Public/Granted day:2008-11-27
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