Invention Grant
- Patent Title: Apparatus for detecting electromagnetic wave
- Patent Title (中): 电磁波检测装置
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Application No.: US12462734Application Date: 2009-08-06
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Publication No.: US08013988B2Publication Date: 2011-09-06
- Inventor: Lin Xiao , Yu-Ying Zhang , Kai-Li Jiang , Liang Liu , Shou-Shan Fan
- Applicant: Lin Xiao , Yu-Ying Zhang , Kai-Li Jiang , Liang Liu , Shou-Shan Fan
- Applicant Address: CN Beijing TW Tu-Cheng, New Taipei
- Assignee: Tsinghua University,Hon Hai Precision Industry Co., ltd.
- Current Assignee: Tsinghua University,Hon Hai Precision Industry Co., ltd.
- Current Assignee Address: CN Beijing TW Tu-Cheng, New Taipei
- Agency: Atlis Law Group, Inc.
- Priority: CN200910106405 20090325
- Main IPC: G01J1/42
- IPC: G01J1/42

Abstract:
An apparatus for detecting electromagnetic wave includes an electromagnetic wave sensor, a first electrode and a second electrode spaced from each other and electrically connected to the electromagnetic wave sensor, and a measuring device electrically connected to the first electrode and the second electrode. The electromagnetic wave sensor includes a carbon nanotube structure. The carbon nanotube structure includes a plurality of carbon nanotubes extending along a same direction from the first electrode to the second electrode. The measuring device is capable of measuring resistance of the carbon nanotube structure.
Public/Granted literature
- US20100245808A1 Apparatus for detecting electromagnetic wave Public/Granted day:2010-09-30
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