Invention Grant
- Patent Title: Calibration device for use in an optical part measuring system
- Patent Title (中): 用于光学部件测量系统的校准装置
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Application No.: US12778721Application Date: 2010-05-12
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Publication No.: US08013990B2Publication Date: 2011-09-06
- Inventor: John D. Spalding
- Applicant: John D. Spalding
- Applicant Address: US MI Davisburg
- Assignee: GII Acquisition, LLC
- Current Assignee: GII Acquisition, LLC
- Current Assignee Address: US MI Davisburg
- Agency: Brooks Kushman P.C.
- Main IPC: G01J1/00
- IPC: G01J1/00

Abstract:
A calibration device for use in an optical, part measuring system is provided. The device has a central axis and a plurality of regions which are rotationally symmetric about the axis. The device includes a series of step-shaped portions defining a multi-step region having a plurality of step edges. A profile of the multi-step region contains information for calibrating the system. The device further includes a plurality of cylindrically-shaped portions spaced apart along the axis and defining constant diameter regions containing information for calibrating the system. The device still further includes a frustum-shaped portion defining a pair of spaced, slope edge regions and a sloped region having boundaries marked by the pair of slope edge regions. The frustum-shaped portion has first and second diameters at its boundaries which define a range of diameters of parts capable of being measured in the system. A profile of the slope edge regions and the sloped region contains information for calibrating the system.
Public/Granted literature
- US20100238435A1 CALIBRATION DEVICE FOR USE IN AN OPTICAL PART MEASURING SYSTEM Public/Granted day:2010-09-23
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