Invention Grant
US08014094B1 Disk drive expediting defect scan when quality metric exceeds a more stringent threshold
有权
当质量度量超过更严格的阈值时，磁盘驱动器加速缺陷扫描
- Patent Title: Disk drive expediting defect scan when quality metric exceeds a more stringent threshold
- Patent Title (中): 当质量度量超过更严格的阈值时，磁盘驱动器加速缺陷扫描
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Application No.: US12551207Application Date: 2009-08-31
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Publication No.: US08014094B1Publication Date: 2011-09-06
- Inventor: Ming Jin
- Applicant: Ming Jin
- Applicant Address: US CA Irvine
- Assignee: Western Digital Technologies, Inc.
- Current Assignee: Western Digital Technologies, Inc.
- Current Assignee Address: US CA Irvine
- Main IPC: G11B27/36
- IPC: G11B27/36
Abstract:
A disk drive is disclosed comprising a head actuated over a disk comprising a plurality of data tracks. Data is read from one of the data tracks to generate a read signal, and a quality metric is generated in response to the read signal. When the quality metric exceeds a first threshold, a defect is detected in at least part of the data track. When the quality metric exceeds a second threshold different than the first threshold, the data track is reread to regenerate the quality metric, and when the quality metric exceeds the second threshold at least twice, the defect is detected.
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