Invention Grant
US08014192B2 Method and device to detect the likely onset of thermal relaxation in magnetic data storage devices 有权
检测磁数据存储装置中可能发生热松弛的方法和装置

  • Patent Title: Method and device to detect the likely onset of thermal relaxation in magnetic data storage devices
  • Patent Title (中): 检测磁数据存储装置中可能发生热松弛的方法和装置
  • Application No.: US10536291
    Application Date: 2003-11-06
  • Publication No.: US08014192B2
    Publication Date: 2011-09-06
  • Inventor: Gavin Nicholas PhillipsHans Marc Bert Boeve
  • Applicant: Gavin Nicholas PhillipsHans Marc Bert Boeve
  • Applicant Address: NL Eindhoven
  • Assignee: NXP B.V.
  • Current Assignee: NXP B.V.
  • Current Assignee Address: NL Eindhoven
  • Priority: EP02080007 20021128
  • International Application: PCT/IB03/05018 WO 20031106
  • International Announcement: WO2004/049343 WO 20040610
  • Main IPC: G11C11/00
  • IPC: G11C11/00
Method and device to detect the likely onset of thermal relaxation in magnetic data storage devices
Abstract:
Reference magnetic elements or bits with a range of magnetic volumes smaller than the minimum size used for actual data storage are written or patterned in the data storage device. The reference elements or bits have dimensions such that their magnetization will relax in a shorter time than that of the minimum expected relaxation time of the storage elements or bits. Probing of the magnetization of the reference elements or bits allows the detection of the probable onset of magnetization relaxation in the storage elements or bits therefore signaling that the re-writing (re-magnetizing) of the storage elements or bits is necessary. Such a scheme can be organized over rows, columns, or sectors.
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