Invention Grant
- Patent Title: Pattern recognizing apparatus, pattern recognizing method and pattern recognizing program
- Patent Title (中): 模式识别装置,模式识别方法和模式识别程序
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Application No.: US12093407Application Date: 2006-11-15
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Publication No.: US08014601B2Publication Date: 2011-09-06
- Inventor: Katsuhiko Takahashi
- Applicant: Katsuhiko Takahashi
- Applicant Address: JP Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2005-344233 20051129
- International Application: PCT/JP2006/322731 WO 20061115
- International Announcement: WO2007/063705 WO 20070607
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
A pattern recognizing method for matching a binary or ternary reference image and an input grayscale image, having a precision similar to the method in which a plurality of binary reference images are generated by supposing settable various binarization threshold value and comparing the distances between the plurality of binary reference images and the grayscale image, and enabling the processing time to be shorter. The first accumulated histogram of the pixels of the grayscale image corresponding to a high density region of the binary reference image and the second accumulated histogram opposite to it and of the pixels of the grayscale image corresponding to the low density region of the reference image are generated and summated. The existence or absence of a pattern is judged by comparing the minimum value of the summated accumulated histogram and a threshold value.
Public/Granted literature
- US20090268964A1 PATTERN RECOGNIZING APPARATUS, PATTERN RECOGNIZING METHOD AND PATTERN RECOGNIZING PROGRAM Public/Granted day:2009-10-29
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