Invention Grant
US08014753B2 Distributed base station test bus architecture in a wireless network
有权
分布式基站测试总线架构在无线网络中
- Patent Title: Distributed base station test bus architecture in a wireless network
- Patent Title (中): 分布式基站测试总线架构在无线网络中
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Application No.: US10893216Application Date: 2004-07-19
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Publication No.: US08014753B2Publication Date: 2011-09-06
- Inventor: Ken L. Cheung , Chen-Huan Chiang , Kenneth Y. Ho , John A. Andersen , Bradford G. Van Treuren , Robert W. Barr , Victor J. Velasco , Dante De Rogatis
- Applicant: Ken L. Cheung , Chen-Huan Chiang , Kenneth Y. Ho , John A. Andersen , Bradford G. Van Treuren , Robert W. Barr , Victor J. Velasco , Dante De Rogatis
- Applicant Address: FR Paris
- Assignee: Alcatel Lucent
- Current Assignee: Alcatel Lucent
- Current Assignee Address: FR Paris
- Agency: Wall & Tong, LLP
- Main IPC: H04M11/00
- IPC: H04M11/00

Abstract:
A distributed test architecture of transmitting boundary scan Test Access Port (TAP_signals over a serial channel is disclosed. The architecture facilitates the system testing and remote field update of distributed base stations in a wireless network. The distributed test architecture enables system testing as if the distributed units are on a backplane within the same chassis by creating a plurality of logical connections between the distributed unit and the test bus using a single bit fiber line and a five bit TAP test bus.
Public/Granted literature
- US20060013146A1 Distributed base station test bus architecture in a wireless network Public/Granted day:2006-01-19
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