Invention Grant
- Patent Title: Test apparatus, test method and manufacturing method
- Patent Title (中): 试验装置,试验方法及制造方法
-
Application No.: US11964719Application Date: 2007-12-27
-
Publication No.: US08014969B2Publication Date: 2011-09-06
- Inventor: Hirokatsu Niijima , Koji Hara , Noriyoshi Kozuka , Kohei Shibata , Tetsuya Sakaniwa
- Applicant: Hirokatsu Niijima , Koji Hara , Noriyoshi Kozuka , Kohei Shibata , Tetsuya Sakaniwa
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Osha • Liang LLP
- Main IPC: G01D3/00
- IPC: G01D3/00

Abstract:
There is provided a test apparatus for testing a plurality of devices under test. The test apparatus includes a signal input section that applies a test signal to the devices under test so as to cause the devices under test to concurrently output response signals, a combining section that generates a single combination signal by using the response signals output from the devices under test, and a judging section that judges whether the devices under test operate normally with reference to the combination signal.
Public/Granted literature
- US20090240365A1 TEST APPARATUS, TEST METHOD AND MANUFACTURING METHOD Public/Granted day:2009-09-24
Information query