Invention Grant
- Patent Title: Method for validation of thermal solution for an electronic component
- Patent Title (中): 用于电子元件热解的验证方法
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Application No.: US11538460Application Date: 2006-10-04
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Publication No.: US08014971B2Publication Date: 2011-09-06
- Inventor: Paul T. Artman , Shawn P. Hoss
- Applicant: Paul T. Artman , Shawn P. Hoss
- Applicant Address: US TX Round Rock
- Assignee: Dell Products L.P.
- Current Assignee: Dell Products L.P.
- Current Assignee Address: US TX Round Rock
- Agency: Haynes and Boone, LLP
- Main IPC: G01K17/00
- IPC: G01K17/00

Abstract:
In one embodiment a method includes operating a component coupled to the system at a first steady state average power consumption, measuring the temperature of the component to produce a first temperature measurement, operating the component at a second, higher power consumption for a first time period, and measuring the temperature of the component at the end of the first time period to produce a second temperature measurement. A transient thermal metric is calculated based at least in part on the first and second temperature measurements, and the transient thermal metric is used to infer the thermal coupling status of a heat dissipation appliance that is nominally thermally coupled to the component.
Public/Granted literature
- US20080086282A1 Method for Validation of Thermal Solution for an Electronic Component Public/Granted day:2008-04-10
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