Invention Grant
US08014975B2 FTIR and EDX spectrum library of contaminants found on a HDD and their potential sources
有权
硬盘驱动器上发现的污染物的FTIR和EDX光谱库及其潜在来源
- Patent Title: FTIR and EDX spectrum library of contaminants found on a HDD and their potential sources
- Patent Title (中): 硬盘驱动器上发现的污染物的FTIR和EDX光谱库及其潜在来源
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Application No.: US11904640Application Date: 2007-09-28
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Publication No.: US08014975B2Publication Date: 2011-09-06
- Inventor: Genevieve R. Atienza , Michele Cabalo , Sharon Capuyan-Agtina , May A. De Guzman-Aguirre , Sharon Del Rosario , Jamie Velacion
- Applicant: Genevieve R. Atienza , Michele Cabalo , Sharon Capuyan-Agtina , May A. De Guzman-Aguirre , Sharon Del Rosario , Jamie Velacion
- Applicant Address: NL Amsterdam
- Assignee: Hitachi Global Storage Technologies, Netherlands B.V.
- Current Assignee: Hitachi Global Storage Technologies, Netherlands B.V.
- Current Assignee Address: NL Amsterdam
- Main IPC: G06F11/32
- IPC: G06F11/32
Abstract:
A data collection for utilization in failure analysis. The data collection includes a material data set including information associated with materials used in a component subject to a failure analysis process. The data collection also includes a source data set including information associated with the sources of the materials. The data collection further includes an image data set including graphical representations of the materials. The data collection is for providing identification of the composition of the contaminant and source of the contaminant.
Public/Granted literature
- US20090089012A1 FTIR and EDX spectrum library of contaminants found on a HDD and their potential sources Public/Granted day:2009-04-02
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