Invention Grant
US08015511B2 Adjustment of mask shapes for improving printability of dense integrated circuit layout 有权
调整面罩形状,提高密集集成电路布局的可印刷性

Adjustment of mask shapes for improving printability of dense integrated circuit layout
Abstract:
Embodiments of the present invention provide a method for making mask shape adjustment The method includes creating a first mask shape; identifying one or more mask segments of the first mask shape as candidate mask segments of needing segment adjustment; applying an optical proximity correction (OPC) process to the first mask shape, the OPC process identifying at least one of the candidate mask segments as a constrained mask segment; applying a rotational adjustment to the constrained mask segment; and creating a second mask shape having the constrained mask segment being rotationally adjusted. A system and a machine-readable medium for performing the above method are also provided.
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