Invention Grant
US08015521B2 Method and system for performing sequential equivalence checking on integrated circuit (IC) designs
有权
在集成电路(IC)设计上执行顺序等效性检查的方法和系统
- Patent Title: Method and system for performing sequential equivalence checking on integrated circuit (IC) designs
- Patent Title (中): 在集成电路(IC)设计上执行顺序等效性检查的方法和系统
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Application No.: US12181638Application Date: 2008-07-29
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Publication No.: US08015521B2Publication Date: 2011-09-06
- Inventor: In-Ho Moon
- Applicant: In-Ho Moon
- Applicant Address: US CA Mountain View
- Assignee: Synopsys, Inc.
- Current Assignee: Synopsys, Inc.
- Current Assignee Address: US CA Mountain View
- Agency: Park, Vaughan, Fleming & Dowler LLP
- Main IPC: G06F17/50
- IPC: G06F17/50 ; G06F9/455

Abstract:
One embodiment of the present invention provides a system that performs sequential equivalence checking between integrated circuit (IC) designs. During operation, the system receives a first IC design and a second IC design. Each of the first and second IC designs includes a top design level and a bottom design level, and the bottom design levels include one or more sub-blocks within the corresponding top design levels. The system then verifies if each of the sub-blocks in the bottom design level of the first design is conditionally equivalent to a corresponding sub-block in the second design. Note that two designs are conditionally equivalent if the two designs can become sequentially equivalent by adding registers on the input and output ports of the two designs. The system additionally verifies if the top design level of the first design is conditionally equivalent to the top design level of the second design and if the first design is temporally equivalent to the second design.
Public/Granted literature
- US20090300563A1 METHOD AND SYSTEM FOR PERFORMING SEQUENTIAL EQUIVALENCE CHECKING ON INTEGRATED CIRCUIT (IC) DESIGNS Public/Granted day:2009-12-03
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