Invention Grant
- Patent Title: Optimal timing-driven cloning under linear delay model
- Patent Title (中): 线性延迟模型下最优时序驱动克隆
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Application No.: US11938824Application Date: 2007-11-13
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Publication No.: US08015532B2Publication Date: 2011-09-06
- Inventor: Charles J. Alpert , Zhuo Li , David A. Papa , Chin Ngai Sze
- Applicant: Charles J. Alpert , Zhuo Li , David A. Papa , Chin Ngai Sze
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Libby Z. Toub; Jack V. Musgrove
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
A timing-driven cloning method iteratively partitions sinks of the net into different sets of clusters and for each set computes a figure of merit for a cloned gate location which optimizes timing based on linear delay, that is, a delay proportional to the distance between the cloned gate location and the sinks. The set having the highest figure of merit is selected as the best solution. The original gate may also be moved to a timing-optimized location. The sinks are advantageously partitioned using boundaries of Voronoi polygons defined by a diamond region surrounding the original gate, or vice versa. The figure of merit may be for example worst slack, a sum of slacks at the sinks in the second cluster, or a linear combination of worst slack and sum of the slacks.
Public/Granted literature
- US20090125859A1 Methods for Optimal Timing-Driven Cloning Under Linear Delay Model Public/Granted day:2009-05-14
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