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US08017943B2 Semiconductor device with reduced pad pitch 有权
具有减小焊盘间距的半导体器件

Semiconductor device with reduced pad pitch
Abstract:
A semiconductor device includes a first pad, a second pad and a third pad. The first pad and the third pad are electrically connected to each other. The first pad and the second pad are used for bonding. The second pad and the third pad are used for probing. According to this structure, Small size semiconductor device having high reliability even after a probing test can be provided.
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