Invention Grant
- Patent Title: Solder joint reliability in microelectronic packaging
- Patent Title (中): 焊接接头在微电子封装中的可靠性
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Application No.: US12610211Application Date: 2009-10-30
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Publication No.: US08018063B2Publication Date: 2011-09-13
- Inventor: Daewoong Suh , Stephen E. Lehman, Jr. , Mukul Renavikar
- Applicant: Daewoong Suh , Stephen E. Lehman, Jr. , Mukul Renavikar
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Blakely, Sokoloff, Taylor & Zafman LLP
- Main IPC: H01L23/48
- IPC: H01L23/48 ; H01L23/52 ; H01L29/40

Abstract:
A microelectronic assembly and method for fabricating the same are described. In an example, a microelectronic assembly includes a microelectronic device having a surface with one or more areas to receive one or more solder balls, the one or more areas having a surface finish comprising Ni. A solder material comprising Cu, such as flux or paste, is applied to the Ni surface finish and one or more solder balls are coupled to the microelectronic device by a reflow process that forms a solder joint between the one or more solder balls, the solder material comprising Cu, and the one or more areas having a surface finish comprising Ni.
Public/Granted literature
- US20100044848A1 SOLDER JOINT RELIABILITY IN MICROELECTRONIC PACKAGING Public/Granted day:2010-02-25
Information query
IPC分类: