Invention Grant
- Patent Title: A/D conversion circuit and test method
- Patent Title (中): A / D转换电路和测试方法
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Application No.: US12662711Application Date: 2010-04-29
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Publication No.: US08018362B2Publication Date: 2011-09-13
- Inventor: Tomoya Katsuki , Shinichirou Saitou
- Applicant: Tomoya Katsuki , Shinichirou Saitou
- Applicant Address: JP Kawasaki-shi, Kanagawa
- Assignee: Renesas Electronics Corporation
- Current Assignee: Renesas Electronics Corporation
- Current Assignee Address: JP Kawasaki-shi, Kanagawa
- Agency: McGinn IP Law Group, PLLC
- Priority: JP2009-114279 20090511
- Main IPC: H03M1/00
- IPC: H03M1/00

Abstract:
An A/D conversion circuit includes a plurality of transmission paths that transmit signal voltages and reference voltages, and an A/D conversion unit that A/D converts voltages output from the transmission paths. Each of the plurality of transmission paths includes a first switch that selectively outputs one of the signal voltage and the reference voltage, an S/H circuit that holds output voltage from the first switch, and a second switch that selectively outputs one of the output voltage from the first switch and output voltage from the S/H circuit.
Public/Granted literature
- US20100283644A1 A/D conversion circute and test method Public/Granted day:2010-11-11
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