Invention Grant
- Patent Title: Contamination prevention system, a lithographic apparatus, a radiation source and a method for manufacturing a device
- Patent Title (中): 防污染系统,光刻设备,辐射源及其制造方法
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Application No.: US11727166Application Date: 2007-03-23
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Publication No.: US08018576B2Publication Date: 2011-09-13
- Inventor: Arnoud Cornelis Wassink
- Applicant: Arnoud Cornelis Wassink
- Applicant Address: NL Veldhoven
- Assignee: ASML Netherlands B.V.
- Current Assignee: ASML Netherlands B.V.
- Current Assignee Address: NL Veldhoven
- Agency: Pillsbury Winthrop Shaw Pittman LLP
- Main IPC: G03B27/42
- IPC: G03B27/42

Abstract:
A contamination prevention system constructed and arranged to prevent material emanating from a radiation source from propagating with radiation from the radiation source into or within a lithographic apparatus. The contamination prevention system includes a channel barrier constructed and arranged to traverse the radiation from the radiation source. The channel barrier includes a plurality of elongated channel members constructed and arranged to absorb or deflect the material. The channel members are rotatable around an axis of rotation by a drive connected to the channel barrier. The contamination prevention system also includes a cooling system provided on an outer surface of the channel barrier.
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