Invention Grant
- Patent Title: Program and sense operations in a non-volatile memory device
- Patent Title (中): 在非易失性存储器件中编程和检测操作
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Application No.: US12274508Application Date: 2008-11-20
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Publication No.: US08018770B2Publication Date: 2011-09-13
- Inventor: Chang Wan Ha
- Applicant: Chang Wan Ha
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Leffert Jay & Polglaze, P.A.
- Main IPC: G11C11/34
- IPC: G11C11/34

Abstract:
Methods for programming and sensing in a memory device, a data cache, and a memory device are disclosed. In one such method, all of the bit lines of a memory block are programmed or sensed during the same program or sense operation by alternately multiplexing the odd or even page bit lines to the dynamic data cache. The dynamic data cache is comprised of dual SDC, PDC, DDC1, and DDC2 circuits such that one set of circuits is coupled to the odd page bit lines and the other set of circuits is coupled to the even page bit lines.
Public/Granted literature
- US20100124115A1 PROGRAM AND SENSE OPERATIONS IN A NON-VOLATILE MEMORY DEVICE Public/Granted day:2010-05-20
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