Invention Grant
- Patent Title: Method of operating nonvolatile memory device and memory system
- Patent Title (中): 操作非易失性存储器件和存储器系统的方法
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Application No.: US12558630Application Date: 2009-09-14
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Publication No.: US08018774B2Publication Date: 2011-09-13
- Inventor: Jung-Seok Hwang , Sangwon Hwang , Jong-Nam Baek
- Applicant: Jung-Seok Hwang , Sangwon Hwang , Jong-Nam Baek
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR10-2008-0104727 20081024
- Main IPC: G11C16/06
- IPC: G11C16/06

Abstract:
A method of operating a nonvolatile memory device includes; performing a verification operation on memory cells while controlling a verification voltage until the memory cells are verification-passed, controlling a level of a bias voltage to be applied to the memory cells according to a level of the verification voltage when the memory cells are verification-passed, and applying the bias voltage to the memory cells.
Public/Granted literature
- US20100103742A1 METHOD OF OPERATING NONVOLATILE MEMORY DEVICE AND MEMORY SYSTEM Public/Granted day:2010-04-29
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