Invention Grant
- Patent Title: Nonvolatile memory device and method of verifying the same
- Patent Title (中): 非易失性存储器件及其验证方法
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Application No.: US12650978Application Date: 2009-12-31
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Publication No.: US08018775B2Publication Date: 2011-09-13
- Inventor: Seung Min Oh
- Applicant: Seung Min Oh
- Applicant Address: KR Gyeonggi-do
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T Group LLP
- Priority: KR10-2009-0047825 20090529
- Main IPC: G11C11/34
- IPC: G11C11/34 ; G11C16/06

Abstract:
A nonvolatile memory device having a memory cell array configured to include a number of memory cells coupled to a bit line, a control circuit configured to output a code signal in response to a verification operation command signal during a verification operation being performed, a page buffer operation voltage generator configured to generate a precharge signal and a sense signal in response to the code signal, and a page buffer configured to precharge the bit line in response to the precharge signal and to sense data programmed into the memory cell in response to the sense signal. A sense signal having a sequentially lowered voltage level is outputted in response to the verification operation being repeatedly performed.
Public/Granted literature
- US20100302852A1 NONVOLATILE MEMORY DEVICE AND METHOD OF VERIFYING THE SAME Public/Granted day:2010-12-02
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