Invention Grant
- Patent Title: Apparatus for measuring in-phase and quadrature (IQ) imbalance
- Patent Title (中): 用于测量同相和正交(IQ)不平衡的装置
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Application No.: US12027742Application Date: 2008-02-07
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Publication No.: US08018990B2Publication Date: 2011-09-13
- Inventor: Kyeongho Lee , Joonbae Park , Jeong Woo Lee , Seung-Wook Lee , Eal Wan Lee
- Applicant: Kyeongho Lee , Joonbae Park , Jeong Woo Lee , Seung-Wook Lee , Eal Wan Lee
- Applicant Address: US CA San Jose
- Assignee: GCT Semiconductor, Inc.
- Current Assignee: GCT Semiconductor, Inc.
- Current Assignee Address: US CA San Jose
- Agency: Muir Patent Consulting, PLLC
- Main IPC: H04B3/46
- IPC: H04B3/46

Abstract:
The present general inventive concept relates to apparatuses and/or methods for measuring an in-phase and quadrature (IQ) imbalance. In one embodiment, a detector can measure an error caused by an IQ imbalance using a first IQ signal including a desired signal and a corresponding image signal by the IQ imbalance. The detector can include a derotator to derotate the first IQ signal by a first angular frequency to obtain a second IQ signal and derotate the first IQ signal by a second angular frequency to obtain a third IQ signal, a DC estimator to obtain a fourth IQ signal corresponding to a DC component of the second IQ signal and a fifth IQ signal corresponding to a DC component of the third IQ signal and a controller can determine a gain error or a phase error from the fourth IQ signal and the fifth IQ signal.
Public/Granted literature
- US20080205502A1 APPARATUS FOR MEASURING IQ IMBALANCE Public/Granted day:2008-08-28
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