Invention Grant
US08026736B2 Water-level charged device model for electrostatic discharge test methods, and apparatus using same
有权
静电放电试验方法的水位充电装置型号及使用该装置的装置
- Patent Title: Water-level charged device model for electrostatic discharge test methods, and apparatus using same
- Patent Title (中): 静电放电试验方法的水位充电装置型号及使用该装置的装置
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Application No.: US12319105Application Date: 2008-12-30
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Publication No.: US08026736B2Publication Date: 2011-09-27
- Inventor: Timothy J. Maloney , Bruce Chou
- Applicant: Timothy J. Maloney , Bruce Chou
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agent John N. Greaves
- Main IPC: G01R31/26
- IPC: G01R31/26 ; G01R31/20
Abstract:
A charged device model (CDM) electrostatic discharge (ESD) testing is carried out at wafer level. Wafer CDM pulses are repeatedly applied and monitored. The wafer CDM (WCDM) pulses are accomplished with a probe-mounted printed-circuit board and a high-frequency transformer that captures fast CDM pulses. Modeling of CDM and WCDM in the time and frequency domain illustrates the dominant effects, and shows that WCDM can reproduce all the major phenomena of package-level CDM testing.
Public/Granted literature
- US20100165537A1 Water-level charged device model for electrostatic discharge test methods, and apparatus using same Public/Granted day:2010-07-01
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