Invention Grant
- Patent Title: Drive circuit of display device and method of testing the same
- Patent Title (中): 显示装置的驱动电路及其测试方法
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Application No.: US11907579Application Date: 2007-10-15
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Publication No.: US08026889B2Publication Date: 2011-09-27
- Inventor: Toshikazu Tazuke
- Applicant: Toshikazu Tazuke
- Applicant Address: JP Kawasaki-shi, Kanagawa
- Assignee: Renesas Electronics Corporation
- Current Assignee: Renesas Electronics Corporation
- Current Assignee Address: JP Kawasaki-shi, Kanagawa
- Agency: McGinn IP Law Group, PLLC
- Priority: JP2006-285281 20061019
- Main IPC: G09G3/36
- IPC: G09G3/36 ; G09G5/10

Abstract:
A first switch circuit is provided between a gradation voltage selection circuit and an output circuit. The output circuit includes a test switch that disconnects the gradation voltage selection circuit from the output circuit in a test mode; a test switch that connects, in the test mode, the gradation voltage selection circuit to a tester connection terminal TESR1; and a test switch that connects, in the test mode, the output circuit to a tester connection terminal TESR2. A second switch circuit is provided between a gradation voltage generation circuit and the gradation voltage selection circuit to disconnect, in the test mode, the gradation voltage generation circuit from the gradation voltage selection circuit.
Public/Granted literature
- US20080094385A1 Drive circuit of display device and method of testing the same Public/Granted day:2008-04-24
Information query
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