Invention Grant
- Patent Title: Defect managing method and defect managing device
- Patent Title (中): 缺陷管理方法和缺陷管理装置
-
Application No.: US12294490Application Date: 2007-03-27
-
Publication No.: US08027235B2Publication Date: 2011-09-27
- Inventor: Yoshihisa Takahashi , Motoshi Ito
- Applicant: Yoshihisa Takahashi , Motoshi Ito
- Applicant Address: JP Osaka
- Assignee: Panasonic Corporation
- Current Assignee: Panasonic Corporation
- Current Assignee Address: JP Osaka
- Agency: Wenderoth Lind & Ponack, L.L.P.
- Priority: JP2006-098820 20060331
- International Application: PCT/JP2007/056399 WO 20070327
- International Announcement: WO2007/144118 WO 20071011
- Main IPC: G11B7/00
- IPC: G11B7/00

Abstract:
Performing sequential recording to alternate destinations of an information recording medium and improving access performance of accessing the information recording medium are achieved by estimating sequential defective areas of the information recording medium based on prescribed conditions, allocating blocks of a spare area as alternate destinations of the defective areas, and performing alternate recording to the allocated alternate destinations, in response to a recording request to record information to the sequential defective areas. The above can be achieved because the use of the alternate destinations will help to prevent a time-out from occurring due to he the defective areas.
Public/Granted literature
- US20100232276A1 DEFECT MANAGING METHOD AND DEFECT MANAGING DEVICE Public/Granted day:2010-09-16
Information query
IPC分类: