Invention Grant
- Patent Title: Scanning probe microscope with independent force control and displacement measurements
- Patent Title (中): 扫描探针显微镜具有独立的力控制和位移测量
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Application No.: US12362359Application Date: 2009-01-29
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Publication No.: US08028343B2Publication Date: 2011-09-27
- Inventor: Warren C. Oliver , John Swindernan , Jennifer Hay , Karmit Parks
- Applicant: Warren C. Oliver , John Swindernan , Jennifer Hay , Karmit Parks
- Applicant Address: US TN Oak Ridge
- Assignee: Nanonmechanics, Inc.
- Current Assignee: Nanonmechanics, Inc.
- Current Assignee Address: US TN Oak Ridge
- Agency: Luedeka, Neely & Graham, P.C.
- Main IPC: G01Q20/02
- IPC: G01Q20/02 ; G01Q10/00 ; G01Q90/00

Abstract:
A nanoindenter that includes an interferometer, a rod, a force actuator and a controller is disclosed. The interferometer generates a light beam that is reflected from a moveable reflector, the interferometer determining a distance between a reference location and the moveable reflector. The rod is characterized by a rod axis and includes a tip on a first end thereof, the rod includes the moveable reflector at a location proximate to the tip. The tip is disposed in a manner that allows the tip to be forced against the surface of a sample. The force actuator applies a force to the rod in a direction parallel to the rod axis in response to a force control signal coupled to the actuator. The controller receives the determined distance from the interferometer and generates the force control signal. The invention can also be used as a scanning probe microscope.
Public/Granted literature
- US20100192267A1 Scanning Probe Microscope with Independent Force Control and Displacement Measurements Public/Granted day:2010-07-29
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