Invention Grant
US08028567B2 AFM tweezers, method for producing AFM tweezers, and scanning probe microscope 有权
AFM镊子,AFM镊子的生产方法和扫描显微镜

AFM tweezers, method for producing AFM tweezers, and scanning probe microscope
Abstract:
AFM tweezers that include a first probe, including a triangular prism member having a tip of a ridge which is usable as a probe tip in a scanning probe microscope, and a second probe, including a triangular prism member provided so as to open/close with respect to the first probe, are provided. The first probe and the second probe are juxtaposed such that a predetermined peripheral surface of the triangular prism member of the first probe and a predetermined peripheral surface of the triangular prism member of the second probe face substantially in parallel to each other, and the first probe formed of a notch that prevents interference with a sample when the sample is scanned by the tip of the ridge.
Information query
Patent Agency Ranking
0/0