Invention Grant
US08028655B2 Plasma processing system with locally-efficient inductive plasma coupling
失效
具有局部高效感应等离子体耦合的等离子体处理系统
- Patent Title: Plasma processing system with locally-efficient inductive plasma coupling
- Patent Title (中): 具有局部高效感应等离子体耦合的等离子体处理系统
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Application No.: US12973227Application Date: 2010-12-20
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Publication No.: US08028655B2Publication Date: 2011-10-04
- Inventor: Jozef Brcka , Rodney Lee Robison
- Applicant: Jozef Brcka , Rodney Lee Robison
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Wood, Herron & Evans, LLP
- Main IPC: C23C16/00
- IPC: C23C16/00 ; C23F1/00 ; H01L21/306 ; H01J7/24 ; H05B31/26

Abstract:
An inductively coupled plasma source is provided with a peripheral ionization source for producing a high-density plasma in a vacuum chamber for semiconductor wafer coating or etching. The source includes a segmented configuration having high and low radiation segments and produces a generally ring-shaped array of alternating high and low energy concentrations in the plasma around the periphery of the chamber. Energy is coupled from a segmented low inductance antenna through a dielectric window or array of windows and through a segmented shield or baffle. The antenna has concentrated conductor segments through which current flows in lengths of closely-spaced windings of a single conductor to produce high magnetic fields that couple through the high-transparency shield segments into the chamber, and alternating distributed conductor segments through which current flows in lengths of more widely-spaced windings of the conductor to produce weaker magnetic fields aligned with more opaque shield sections that couple less energy to the plasma.
Public/Granted literature
- US20110146911A1 PLASMA PROCESSING SYSTEM WITH LOCALLY-EFFICIENT INDUCTIVE PLASMA COUPLING Public/Granted day:2011-06-23
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