Invention Grant
- Patent Title: Integrated image quality test for imaging system
- Patent Title (中): 成像系统的综合图像质量检测
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Application No.: US12315026Application Date: 2008-11-26
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Publication No.: US08028909B2Publication Date: 2011-10-04
- Inventor: Christopher Warren Brock , Jonathan Chin , Christopher Fjellstad , David P. Goren , Patrick Mauro , David Tsi-Shi , Michael Steele
- Applicant: Christopher Warren Brock , Jonathan Chin , Christopher Fjellstad , David P. Goren , Patrick Mauro , David Tsi-Shi , Michael Steele
- Applicant Address: US NY Holtsville
- Assignee: Symbol Technologies, Inc.
- Current Assignee: Symbol Technologies, Inc.
- Current Assignee Address: US NY Holtsville
- Agent Nonggiang Fan
- Main IPC: G06K7/00
- IPC: G06K7/00

Abstract:
An imaging system with in-field image quality testing and reporting features, includes a housing, and a solid-state imager having an array of image sensors supported by the housing for capturing return light from a target located in a range of working distances from the housing in an image capture mode of operation, and for capturing return light from a test pattern positioned at a predetermined position in the range of working distances in a test mode of operation different from the image capture mode. An electrical signal indicative of the captured return light is generated in each mode. A memory is supported by the housing for storing a test program for testing image quality. A controller is supported by the housing for processing the electrical signal in the image capture mode, and for accessing the memory to enable the controller to execute the test program in the test mode to test the image quality of the test pattern imaged by the imaging system, and for reporting test results of the image quality of the test pattern.
Public/Granted literature
- US20100127078A1 Integrated image quality test for imaging system Public/Granted day:2010-05-27
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